Test Procedure |
MIL-STD-883 Method |
MIL-STD-883 Condition |
Detail Requirements |
MDI Screening |
Nondestruct Bond Pull |
2023 |
|
100% Wires 2% PDA |
Same |
| Internal Visual |
2017 |
|
|
Same |
| Temperature Cycling |
1010 |
B |
-55°C to +125°C 10 Cycles |
Same |
| Mechanical Shock or Constant Acceleration |
2002 and 2001 |
B1 Y1 Only A1 Y1 Only |
1500Gs 5000 Gs |
Constant Acceleration 500 Gs standard1 |
| Pind |
2020 |
B |
10 Gs, 60 HZ |
Same |
| Electrical Test |
|
|
Functional Test |
Same |
| Burn-in (85°C) |
1015 |
|
N/A (Maximum applied voltage and current) |
85°C Tcase 320 hrs (Nominal input voltage and 100% rated load) |
| Final Electrical Test |
|
|
MDI ATP PDA = 2% or 1 device |
Same -55°C, 25°C, 85°C testing with data |
| Fine Leak |
1014 |
A1 or A2 |
Dependent on Vacant Interior Cavity of Hybrid |
Same |
| Gross Leak |
1014 |
C1 |
|
Same |
| Radiography |
2012 |
|
Y Direction |
Same |
| External Visual |
2009 |
|
|
Same |
Note 1 Higher acceleration test levels available: Consult factory. |
| |
| |
|
Page Revised 06/13/2006 |